‘Hot’ new form of microscopy examines materials using evanescent waves
- Advertisement -
A team of researchers has built a prototype microscope that does not rely on backscattered radiation, instead uses passive detection of thermally excited evanescent waves. They have examined dielectric materials with passive near-field spectroscopy to develop a detection model to further refine the technique, working to develop a new kind of microscopy for examining nanoscopic material surfaces.
Views: 145
- Advertisement -
error: Content is protected !!